AMI Instruments is proud to have participated in the 75th Annual Denver X-ray Conference (DXC 2026), held August 3–7, 2026 at the Westin Chicago Lombard, Lombard, Illinois. The AMI | STOE team was excited to kick off this milestone edition of the world’s largest annual X-ray analysis forum, connecting with the X-ray diffraction community, sharing ideas, and discussing the latest advances in materials characterization.
DXC 2026 marked a major milestone — 75 years since the Denver X-ray Conference first gathered 35 participants on the University of Denver campus. From those origins, it has grown into the internationally recognized leading annual forum on general X-ray analysis, covering both X-ray fluorescence (XRF) and X-ray diffraction (XRD). AMI and STOE were proud to be part of this landmark anniversary event.
DXC 2026 brought together researchers, industrial practitioners, and instrument manufacturers from around the world to exchange knowledge across the full spectrum of X-ray analysis. For AMI and STOE, the conference provided an important opportunity to connect directly with the X-ray analysis community and discuss the technologies advancing modern materials characterization.
About the Conference
75th Annual Denver X-ray Conference
The Denver X-ray Conference is the world’s largest annual forum dedicated to X-ray fluorescence and X-ray diffraction analysis. Organized by the International Centre for Diffraction Data (ICDD), DXC brings together researchers, industrial practitioners, and instrument manufacturers from around the world to share the latest scientific and technical developments across all areas of X-ray analysis.
The conference features a comprehensive program of workshops, oral sessions, and poster presentations covering practical applications across materials science, chemistry, geology, pharmaceuticals, semiconductors, metals and alloys, and more. The annual proceedings, published in Advances in X-ray Analysis (Volume 70 for DXC 2026), provide a lasting record of the technical contributions presented at each conference.
Location: Westin Chicago Lombard, Lombard, Illinois, USA | Dates: August 3–7, 2026 | Website: dxcicdd.com
DXC 2026 marked 75 years of advancing X-ray analysis, making this year’s conference a particularly significant milestone for the global X-ray analysis community.
Why DXC 2026 Matters
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The world’s largest annual forum on X-ray fluorescence and X-ray diffraction, marking 75 years of advancing X-ray analysis.
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Workshops run by experts providing practical training in XRF and XRD applications across a wide range of industries.
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Oral sessions and poster presentations showcasing the latest developments in instrumentation, software, and methodology.
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Annual proceedings published in Advances in X-ray Analysis, a reference series spanning more than 30 volumes.
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A critical venue for instrument manufacturers and the X-ray analysis community to connect and collaborate directly.
Conference Focus Areas
X-ray Analysis & Materials Characterization
DXC 2026 covered the full breadth of X-ray analysis, from fundamental technique through applied industrial characterization across a wide range of scientific and industrial applications.
Powder X-ray Diffraction (XRD) | X-ray Fluorescence (XRF) | Single Crystal Diffraction | Phase Identification & Quantification | Rietveld Refinement | Total Scattering / PDF | Thin Film Analysis | Residual Stress Measurement | Texture Analysis | Energy Dispersive XRF | Instrumentation Advances | Pharmaceutical & Materials Applications
AMI’s Participation at DXC 2026
AMI | STOE X-ray Diffraction Solutions
AMI Instruments participated in DXC 2026 alongside STOE & Cie GmbH, AMI’s partner for X-ray diffraction instruments. The AMI | STOE booth showcased STOE XRD systems — now part of the AMI family — delivering “Innovation Within Reach” through high-performance solutions for research and industry.
The booth featured instruments and resources covering powder diffraction, single-crystal XRD, and advanced applications across the X-ray characterization workflow.
- Powder diffraction: AMI’s STOE-powered XRD systems for phase identification, quantitative phase analysis, Rietveld refinement, and high-resolution powder diffraction.
- Single crystal XRD: precision single-crystal X-ray diffractometers for ab initio structure determination and small-molecule crystallography.
- Advanced applications: in situ XRD, non-ambient diffraction, and the Nexus Series integrated XRD–sorption analysis platform for simultaneous structural and adsorption characterization.
DXC is one of the most important annual venues for AMI and STOE to connect with the global X-ray analysis community, and the 75th anniversary edition made this year’s participation particularly meaningful. Whether attendees were interested in powder diffraction, single-crystal diffraction, advanced in situ applications, or simply wanted to discuss how XRD instruments are evolving, the AMI | STOE team was on hand throughout the week.
With the addition of STOE’s XRD portfolio, including the Lattice Series benchtop powder diffractometers and the Nexus Series integrated XRD–sorption platform, AMI now offers a comprehensive X-ray diffraction lineup built on STOE’s tradition of precision diffraction instrumentation since 1887, combined with AMI’s global distribution, service network, and complementary portfolio of gas adsorption, thermal analysis, and reactor characterization instruments.
Thank You for Connecting
AMI | STOE at DXC 2026
We thank everyone who visited the AMI | STOE booth at DXC 2026 and connected with our team in Lombard. The conversations, ideas, and collaborations from the conference continue to shape how we develop XRD instruments and support the X-ray analysis community.
To learn more about AMI’s X-ray diffraction instruments and analytical solutions, or to discuss how they can support your research or industrial workflow, please contact us or explore our XRD product range.