X-ray diffraction (XRD) of mesoporous materials characterizes the long-range periodic ordering of the pore structure by measuring diffraction peaks that arise from the regular spacing between pore channels. For hexagonally ordered materials like MCM-41 and SBA-15, the (100), (110), and (200) reflections in the small-angle region (below 5° 2θ) identify the P6mm space group and the interplanar spacings from which the unit cell parameter — directly related to pore-to-pore distance — is calculated. The number, position, and relative intensity of these peaks report on both the type of ordering and its quality.